ETMC Technologies supplies supplies Flight Test Instrumentation (FTI) from two of the world's leaders in this space: Curtiss Wright and Safran Data Systems.
These compact high performance systems are designed to complement the work of your fligh test team by being easy to use, reliable, robust and accurate.
It does not matter if you have only a handful of channels or need a distributed system with thousands of channels, we can assist you with tailoring just the right system for your needs which can then allow you to reconfigure it quickly and easily for the next test - we have customers who seamlessly use the same hardware for multiple flight tests with different configurations and settings on the same day!
The ACRA KAM-500 system from Curtiss-Wright has been around for over 20 years and gives you peace of mind knowing that it has been (and is being) used in over 40 countries around the world and on several hundred different platforms - everything from the A380 down to light utility planes, all sorts of helicopters and UAVs as well as being sent into outer space (the video docking system on the Dragon X re-usable space capsule uses a KAM-500 system).
The Heim MDR from Safran Data Systems is a modern modular high speed data capture and recording front-end that leverages 4 decades of airborne recording experience. Teh Heim MDR reliably records data at throughputs of up to 800 Mbits per second! The modular flexibility of the Heim MDR means that you can mix-and-match capability in this system that will just work!
ETMC Technologies is able to assist you with local support to answer most of the questions that you are likely to have in regard to operation, configuration, setup and trouble-shooting of these systems. On-site assistance and technical training for that added peace of mind is also available and integral to what we deliver.
Speak with us to learn how ETMC Technologies can assist you to be more productive and efficient with Flight Test Instrumentation (FTI) solutions from Curtiss-Wright and Safran Data Systems.
